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        <title>Electron beam control in a scanning electron microscope</title>
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        <description>I describe electron beam optics and deflection as they are employed in scanning electron microscopy. http://web.jfet.org/vclk/ - Deflection amplifier http://www.johngineer.com/blog/?p=648 - CRT Christmas tree http://www.fei.com/ - FEI Company</description>
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